Abstract
A new model-based method for analyzing learning processes in so-called short-term learning tests is proposed and applied. Learning is measured by means of a two-dimensional item response theory model that incorporates two latent factors: ability level and learning ability. The model allows one to assess the impact of both variables and their correlation for given data sets in a manner that implicitly corrects for statistical artifacts that arise in conventional analyses. The model is applied to four shortterm learning tests administered to N =434 children aged five to six years. Model tests and tests for empirical validity of the model parameters succeed in establishing construct validity for one of these tests.
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Klauer, K.C., Sydow, H. (2001). Modeling Learning in Short-Term Learning Tests. In: Boomsma, A., van Duijn, M.A.J., Snijders, T.A.B. (eds) Essays on Item Response Theory. Lecture Notes in Statistics, vol 157. Springer, New York, NY. https://doi.org/10.1007/978-1-4613-0169-1_4
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DOI: https://doi.org/10.1007/978-1-4613-0169-1_4
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